Hsu, K. H., Jia, C., Zhang, E. Z., Jost, D., Moritz, B., Hackl, R., & Devereaux, T. P. (2025). Detection of chiral spin fluctuations driven by frustration in Mott insulators.
Style de citation Chicago (17e éd.)Hsu, Kuan H., Chunjing Jia, Emily Z. Zhang, Daniel Jost, Brian Moritz, Rudi Hackl, et Thomas P. Devereaux. Detection of Chiral Spin Fluctuations Driven by Frustration in Mott Insulators. 2025.
Style de citation MLA (9e éd.)Hsu, Kuan H., et al. Detection of Chiral Spin Fluctuations Driven by Frustration in Mott Insulators. 2025.
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