Wang, S., Huang, M., Wei, S., Gong, X., & Chen, S. (2025). Carrier Emission and Capture Competition mediated A(n)BC Recombination Model in Semiconductors with Multi-Level Defects.
Chicago Style (17th ed.) CitationWang, Shanshan, Menglin Huang, Su-Huai Wei, Xin-Gao Gong, and Shiyou Chen. Carrier Emission and Capture Competition Mediated A(n)BC Recombination Model in Semiconductors with Multi-Level Defects. 2025.
MLA (9th ed.) CitationWang, Shanshan, et al. Carrier Emission and Capture Competition Mediated A(n)BC Recombination Model in Semiconductors with Multi-Level Defects. 2025.
Warning: These citations may not always be 100% accurate.