van Haren, M., Blanken, L., Classens, K., & Oomen, T. (2025). Local Rational Modeling for Identification Beyond the Nyquist Frequency: Applied to a Prototype Wafer Stage.
Chicago Style (17th ed.) Citationvan Haren, Max, Lennart Blanken, Koen Classens, and Tom Oomen. Local Rational Modeling for Identification Beyond the Nyquist Frequency: Applied to a Prototype Wafer Stage. 2025.
MLA (9th ed.) Citationvan Haren, Max, et al. Local Rational Modeling for Identification Beyond the Nyquist Frequency: Applied to a Prototype Wafer Stage. 2025.
Warning: These citations may not always be 100% accurate.