Salami, R., Poley, L., Affolder, K., Affolder, T., Bayer, L., Crick, B., . . . Wang, A. Z. (2025). Quality Concerns Caused by Quality Control -- deformation of silicon strip detector modules in thermal cycling tests.
Chicago Style (17th ed.) CitationSalami, Richard, et al. Quality Concerns Caused by Quality Control -- Deformation of Silicon Strip Detector Modules in Thermal Cycling Tests. 2025.
MLA (9th ed.) CitationSalami, Richard, et al. Quality Concerns Caused by Quality Control -- Deformation of Silicon Strip Detector Modules in Thermal Cycling Tests. 2025.
Warning: These citations may not always be 100% accurate.