Salami, R., Poley, L., Affolder, K., Affolder, T., Bayer, L., Crick, B., . . . Wang, A. Z. (2025). Quality Concerns Caused by Quality Control -- deformation of silicon strip detector modules in thermal cycling tests.
Chicago-Zitierstil (17. Ausg.)Salami, Richard, et al. Quality Concerns Caused by Quality Control -- Deformation of Silicon Strip Detector Modules in Thermal Cycling Tests. 2025.
MLA-Zitierstil (9. Ausg.)Salami, Richard, et al. Quality Concerns Caused by Quality Control -- Deformation of Silicon Strip Detector Modules in Thermal Cycling Tests. 2025.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.