Deepfake Sentry: Harnessing Ensemble Intelligence for Resilient Detection and Generalisation
di: Ştefan, Liviu-Daniel, et al.
Pubblicazione: (2024)

Investigation of Al-Free Laser Quantum-Well Semiconductor Structure by LSM
di: Stanciu, G. - Botez D
Pubblicazione: (2002)

Special non-Kähler metrics -- old and new
di: Ornea, Liviu, et al.
Pubblicazione: (2025)

Vaisman's theorem and local reducibility
di: Preda, Ovidiu, et al.
Pubblicazione: (2024)

Super-resolution AWGs based on the Moirè effect
di: Cincotti, Gabriella
Pubblicazione: (2025)

Chapter Atomic Force Microscopy in Optical Imaging and Characterization
di: Veis, Martin, et al.
Pubblicazione: (2021)

Special non-Kähler metrics on Endo-Pajitnov manifolds
di: Ciulică, Cristian, et al.
Pubblicazione: (2024)

Enhancing Membrane-Based Scanning Force Microscopy Through an Optical Cavity
di: Gisler, Thomas, et al.
Pubblicazione: (2024)

Efficient Reduction of Casimir Forces by Self‐Assembled Bio‐Molecular Thin Films
di: René I.P. Sedmik, et al.
Pubblicazione: (2024)

Standardizing Force Reconstruction in Dynamic Atomic Force Microscopy
di: Laflamme, Simon, et al.
Pubblicazione: (2025)

Fault-Tolerant, Rigidity-Preserving Control of Inflatable Truss Robots
di: Wade, James, et al.
Pubblicazione: (2026)

Applications of Atomic Force Microscopy in Epitaxial Nanotechnology
di: Sheglov, Dmitry - Kosolobov, Sergey - Rodyakina, Ekaterina - Latyshev, Alexander
Pubblicazione: (2029)

Atomic Force Microscopy of Emulsions and Their Interfacial Nanoparticles
di: Ville A. Lovikka, et al.
Pubblicazione: (2025)

Conducting Atomic Force Microscopy of Protein Wires
di: Brian Ashcroft, et al.
Pubblicazione: (2025)

Use of Scanning Tunnelling Microscopy for Atomic Manipulation on Semiconductors
di: Houselt, Ari van - Zandvliet, J. W
Pubblicazione: (2074)

Inverted-Mode Scanning Tunneling Microscopy for Atomically Precise Fabrication
di: Barrera, Eduardo, et al.
Pubblicazione: (2025)

Atomic Force Microscopy Images of PDA and BPDA films
di: Coy Romero, Luis Emerson, et al.
Pubblicazione: (2025)

Structure discovery in Atomic Force Microscopy imaging of ice
di: Priante, F., et al.
Pubblicazione: (2023)

Combined Atomic Force and Confocal Microscopy for Biological Processes
di: Horton, Mike - Lehenkari, Petri - Charras, Ghillaume
Pubblicazione: (1962)

Use of Functionalized Atomic Force Microscopy Probes in Biophysics
di: Dufrêne, Yves F
Pubblicazione: (1957)

Tribology of ZrC Coatings and Spherical Tips Acquired with Extraordinarily Stiff, Metal Atomic Force Microscopy Probes
di: Piotr Jenczyk, et al.
Pubblicazione: (2025)

Scanning Electron Microscopy
di: Elizabeth R. Fischer, et al.
Pubblicazione: (2024)

Decoding Orbital Angular Momentum in Turbid Tissue-like Scattering Medium via Fourier-Domain Deep Learning
di: Yosovich, Avraham, et al.
Pubblicazione: (2025)

Atomic Force Microscopy Studies of the Surface Properties of Microbial Cells
di: Wright, C. J. - Armstrong, I
Pubblicazione: (2007)

Time‐Domain Near‐Field Scanning Microscopy of Terahertz Metasurfaces
di: Ruxue Wei, et al.
Pubblicazione: (2026)

Stress Echocardiography Revisited: Toward Improving Patient Selection and Clinical Decision‐Making
di: Silviu Stanciu, et al.
Pubblicazione: (2025)

Scanning Ion Conductance Microscopy: Zero Force Imaging of Living Cells
di: Wilkins, Shelley J. - Finlan, Martin F. - Finlan, Corinne S. G
Pubblicazione: (2075)

Detecting Cancer Cells in Normal Tissue by Scanning Force Modulation Microscopy
di: Perdonet, Nadine - Jurukovski, Vladimir - Fields, Jessica - Fields, Adam - Ramek, Alex - Tmironav, Tatiana - Ghosh, Kaustabh - Bernheim, Taylor - Hall, Kristin - Ge, Shouren - Slutsky, Lenny - Dorst , Katherine - Simon, Marcia - Rafailovich, Miriam
Pubblicazione: (2071)

Optically Distortion‐Free Mica‐Glass Hybrid Substrates for Quantitative Correlative Atomic Force and Fluorescence Microscopy
di: Shuho Nozue, et al.
Pubblicazione: (2026)

Evaluation of Analytical Models in Scattering Scanning Near-field Optical Microscopy for High Spatial Resolution Spectroscopy
di: Khajavi, Soheil, et al.
Pubblicazione: (2024)

3D Nanoscale Electromechanical Imaging with Interferometric Atomic Force Microscopy
di: Proksch, Roger, et al.
Pubblicazione: (2024)

Torsional Force Microscopy of Van der Waals Moirés and Atomic Lattices
di: Pendharkar, Mihir, et al.
Pubblicazione: (2023)

3D Vector Piezoresponse Imaging with Interferometric Atomic Force Microscopy
di: Roger Proksch, et al.
Pubblicazione: (2025)

Perspectives on Atomic Force Microscopy for Investigating Microbial Extracellular Electron Transfer
di: Xiaochun Tian, et al.
Pubblicazione: (2026)

A Bi-channel Aided Stitching of Atomic Force Microscopy Images
di: Zhao, Huanhuan, et al.
Pubblicazione: (2025)

Optimizing Single‐Cell Measurement Using Dynamic Atomic Force Microscopy
di: Indrianita Lionadi, et al.
Pubblicazione: (2025)