Pan, W., Wei, W., Zhu, F., & Deng, Y. (2025). Enhanced Sample Selection with Confidence Tracking: Identifying Correctly Labeled yet Hard-to-Learn Samples in Noisy Data.
Chicago-Zitierstil (17. Ausg.)Pan, Weiran, Wei Wei, Feida Zhu, und Yong Deng. Enhanced Sample Selection with Confidence Tracking: Identifying Correctly Labeled yet Hard-to-Learn Samples in Noisy Data. 2025.
MLA-Zitierstil (9. Ausg.)Pan, Weiran, et al. Enhanced Sample Selection with Confidence Tracking: Identifying Correctly Labeled yet Hard-to-Learn Samples in Noisy Data. 2025.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.