APA (7th ed.) Citation

Sorgenfrei, N., Arnqvist, E., Gurimskaya, Y., Moll, M., Parzefall, U., Rizwan, F., & Wiehe, M. (2025). Characterisation of Crystalline Defects in 4H Silicon Carbide using DLTS and TSC.

Chicago Style (17th ed.) Citation

Sorgenfrei, Niels, Elias Arnqvist, Yana Gurimskaya, Michael Moll, Ulrich Parzefall, Faiza Rizwan, and Moritz Wiehe. Characterisation of Crystalline Defects in 4H Silicon Carbide Using DLTS and TSC. 2025.

MLA (9th ed.) Citation

Sorgenfrei, Niels, et al. Characterisation of Crystalline Defects in 4H Silicon Carbide Using DLTS and TSC. 2025.