Kang, M., Kim, S., Go, E., Paek, D., Lim, G., Kim, M., . . . Kim, H. (2025). In-situ and Non-contact Etch Depth Prediction in Plasma Etching via Machine Learning (ANN & BNN) and Digital Image Colorimetry.
Chicago Style (17th ed.) CitationKang, Minji, et al. In-situ and Non-contact Etch Depth Prediction in Plasma Etching via Machine Learning (ANN & BNN) and Digital Image Colorimetry. 2025.
MLA (9th ed.) CitationKang, Minji, et al. In-situ and Non-contact Etch Depth Prediction in Plasma Etching via Machine Learning (ANN & BNN) and Digital Image Colorimetry. 2025.
Warning: These citations may not always be 100% accurate.