APA (7th ed.) Citation

Barusco, M., Borsatti, F., Khalifa, Y. B., Pezze, D. D., & Susto, G. A. (2025). Evaluating Modern Visual Anomaly Detection Approaches in Semiconductor Manufacturing: A Comparative Study.

Chicago Style (17th ed.) Citation

Barusco, Manuel, Francesco Borsatti, Youssef Ben Khalifa, Davide Dalle Pezze, and Gian Antonio Susto. Evaluating Modern Visual Anomaly Detection Approaches in Semiconductor Manufacturing: A Comparative Study. 2025.

MLA (9th ed.) Citation

Barusco, Manuel, et al. Evaluating Modern Visual Anomaly Detection Approaches in Semiconductor Manufacturing: A Comparative Study. 2025.