Shinde, P. P., Pai, P. P., Adiga, S. P., Mayya, K. S., Seo, Y., Hwang, M., . . . Park, C. (2025). Defect Detection in Photolithographic Patterns Using Deep Learning Models Trained on Synthetic Data.
Chicago Style (17th ed.) CitationShinde, Prashant P., Priyadarshini P. Pai, Shashishekar P. Adiga, K. Subramanya Mayya, Yongbeom Seo, Myungsoo Hwang, Heeyoung Go, and Changmin Park. Defect Detection in Photolithographic Patterns Using Deep Learning Models Trained on Synthetic Data. 2025.
MLA (9th ed.) CitationShinde, Prashant P., et al. Defect Detection in Photolithographic Patterns Using Deep Learning Models Trained on Synthetic Data. 2025.
Warning: These citations may not always be 100% accurate.