Scholten, S. C., Iwański, J., Xing, K., Binder, J., Dąbrowska, A. K., Tan, H. H., . . . Tetienne, J. (2025). Optically detected magnetic resonance of wafer-scale hexagonal boron nitride thin films.
Citazione stile Chigago Style (17a edizione)Scholten, Sam C., et al. Optically Detected Magnetic Resonance of Wafer-scale Hexagonal Boron Nitride Thin Films. 2025.
Citatione MLA (9a ed.)Scholten, Sam C., et al. Optically Detected Magnetic Resonance of Wafer-scale Hexagonal Boron Nitride Thin Films. 2025.
Attenzione: Queste citazioni potrebbero non essere precise al 100%.