WeiQuan, W., & Mian, R. (2025). Optimizing FPGA and Wafer Test Coverage with Spatial Sampling and Machine Learning.
Chicago Style (17th ed.) CitationWeiQuan, Wang, and Riaz-ul-Haque Mian. Optimizing FPGA and Wafer Test Coverage with Spatial Sampling and Machine Learning. 2025.
MLA (9th ed.) CitationWeiQuan, Wang, and Riaz-ul-Haque Mian. Optimizing FPGA and Wafer Test Coverage with Spatial Sampling and Machine Learning. 2025.
Warning: These citations may not always be 100% accurate.