Cita APA (7a ed.)

Cantú, E. D., Wittmann, R. K., Abdeen, O., Wagner, P., Samek, W., Baier, M., & Lapuschkin, S. (2025). Deep Learning-based Multi Project InP Wafer Simulation for Unsupervised Surface Defect Detection.

Cita Chicago Style (17a ed.)

Cantú, Emílio Dolgener, Rolf Klemens Wittmann, Oliver Abdeen, Patrick Wagner, Wojciech Samek, Moritz Baier, y Sebastian Lapuschkin. Deep Learning-based Multi Project InP Wafer Simulation for Unsupervised Surface Defect Detection. 2025.

Cita MLA (9a ed.)

Cantú, Emílio Dolgener, et al. Deep Learning-based Multi Project InP Wafer Simulation for Unsupervised Surface Defect Detection. 2025.