Cantú, E. D., Wittmann, R. K., Abdeen, O., Wagner, P., Samek, W., Baier, M., & Lapuschkin, S. (2025). Deep Learning-based Multi Project InP Wafer Simulation for Unsupervised Surface Defect Detection.
Style de citation Chicago (17e éd.)Cantú, Emílio Dolgener, Rolf Klemens Wittmann, Oliver Abdeen, Patrick Wagner, Wojciech Samek, Moritz Baier, et Sebastian Lapuschkin. Deep Learning-based Multi Project InP Wafer Simulation for Unsupervised Surface Defect Detection. 2025.
Style de citation MLA (9e éd.)Cantú, Emílio Dolgener, et al. Deep Learning-based Multi Project InP Wafer Simulation for Unsupervised Surface Defect Detection. 2025.
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