Yoon, C., Ahn, J., Zhou, Y., Kulkarni, J. P., & Dodabalapur, A. (2025). Enhancing Gate Control and Mitigating Short Channel Effects in 20-50 nm Channel Length Amorphous Oxide Thin Film Transistors.
Chicago Style (17th ed.) CitationYoon, Chankeun, Juhan Ahn, Yuchen Zhou, Jaydeep P. Kulkarni, and Ananth Dodabalapur. Enhancing Gate Control and Mitigating Short Channel Effects in 20-50 Nm Channel Length Amorphous Oxide Thin Film Transistors. 2025.
MLA (9th ed.) CitationYoon, Chankeun, et al. Enhancing Gate Control and Mitigating Short Channel Effects in 20-50 Nm Channel Length Amorphous Oxide Thin Film Transistors. 2025.
Warning: These citations may not always be 100% accurate.