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Bibliographic Details
Main Authors: Zhachuk, R., Coutinho, J., Sheglov, D.
Format: Preprint
Published: 2025
Subjects:
Online Access:https://arxiv.org/abs/2506.15219
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author Zhachuk, R.
Coutinho, J.
Sheglov, D.
author_facet Zhachuk, R.
Coutinho, J.
Sheglov, D.
contents The atomic structure of Si tetramers that form on the Si$(111)\textrm{-}7\times7$ surface during homoepitaxy, is investigated by means of first principles calculations with the currently available atomistic model as starting point. It is demonstrated that the rectangular shape of the Si tetramer is unstable against buckling. Comparison of calculated results with available scanning tunnelling microscopy (STM) data provides a new understanding of the problem, indicating that the recorded STM images are influenced by dynamic buckling.
format Preprint
id arxiv_https___arxiv_org_abs_2506_15219
institution arXiv
publishDate 2025
record_format arxiv
spellingShingle Dynamic buckling of Si tetramers on the Si(111)-7x7
Zhachuk, R.
Coutinho, J.
Sheglov, D.
Materials Science
The atomic structure of Si tetramers that form on the Si$(111)\textrm{-}7\times7$ surface during homoepitaxy, is investigated by means of first principles calculations with the currently available atomistic model as starting point. It is demonstrated that the rectangular shape of the Si tetramer is unstable against buckling. Comparison of calculated results with available scanning tunnelling microscopy (STM) data provides a new understanding of the problem, indicating that the recorded STM images are influenced by dynamic buckling.
title Dynamic buckling of Si tetramers on the Si(111)-7x7
topic Materials Science
url https://arxiv.org/abs/2506.15219