A new angle on stacking faults: Overcoming the edge-on limit in high-resolution defect analysis

Fuente: arXiv

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Bibliographic Details
Main Authors:	Karpstein, Nicolas, Müller, Lukas, Bezold, Andreas, Mills, Michael J., Neumeier, Steffen, Spiecker, Erdmann
Format:	Preprint
Published:	2025
Subjects:	Materials Science
Online Access:	Acceder al recurso
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Internet

https://arxiv.org/abs/2506.15510