APA (7th ed.) Citation

Karpstein, N., Müller, L., Bezold, A., Mills, M. J., Neumeier, S., & Spiecker, E. (2025). A new angle on stacking faults: Overcoming the edge-on limit in high-resolution defect analysis.

Chicago Style (17th ed.) Citation

Karpstein, Nicolas, Lukas Müller, Andreas Bezold, Michael J. Mills, Steffen Neumeier, and Erdmann Spiecker. A New Angle on Stacking Faults: Overcoming the Edge-on Limit in High-resolution Defect Analysis. 2025.

MLA (9th ed.) Citation

Karpstein, Nicolas, et al. A New Angle on Stacking Faults: Overcoming the Edge-on Limit in High-resolution Defect Analysis. 2025.