Fornos, C., Alyabyeva, N., Ho, W. Y., Roubert, C., Tak, T., Speck, J. S., . . . Rowe, A. C. H. (2025). Nanoscale imaging of reduced forward bias at V-defects in green-emitting nitride LEDs.
Cita Chicago Style (17a ed.)Fornos, C., N. Alyabyeva, W. Y. Ho, C. Roubert, T. Tak, J. S. Speck, C. Weisbuch, J. Peretti, y A. C. H. Rowe. Nanoscale Imaging of Reduced Forward Bias at V-defects in Green-emitting Nitride LEDs. 2025.
Cita MLA (9a ed.)Fornos, C., et al. Nanoscale Imaging of Reduced Forward Bias at V-defects in Green-emitting Nitride LEDs. 2025.
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