APA (7th ed.) Citation

Zhang, T., Holzer, J., Vystavěl, T., Kolíbal, M., de Araújo, E. P., Stephens, C., & Britton, T. B. (2025). Characterization of WSe$_2$ films using reflection Kikuchi diffraction in the scanning electron microscope and multivariate statistical analyses.

Chicago Style (17th ed.) Citation

Zhang, Tianbi, Jakub Holzer, Tomáš Vystavěl, Miroslav Kolíbal, Estácio Paiva de Araújo, Chris Stephens, and T. Ben Britton. Characterization of WSe$_2$ Films Using Reflection Kikuchi Diffraction in the Scanning Electron Microscope and Multivariate Statistical Analyses. 2025.

MLA (9th ed.) Citation

Zhang, Tianbi, et al. Characterization of WSe$_2$ Films Using Reflection Kikuchi Diffraction in the Scanning Electron Microscope and Multivariate Statistical Analyses. 2025.