Cao, N. M., Hatch, D. R., Michoski, C., Oliver, T. A., Eldon, D., Nelson, A. O., & Waller, M. (2025). Quantifying Resolution Limits in Pedestal Profile Measurements with Gaussian Process Regression.
Chicago Style (17th ed.) CitationCao, Norman M., David R. Hatch, Craig Michoski, Todd A. Oliver, David Eldon, Andrew Oakleigh Nelson, and Matthew Waller. Quantifying Resolution Limits in Pedestal Profile Measurements with Gaussian Process Regression. 2025.
MLA (9th ed.) CitationCao, Norman M., et al. Quantifying Resolution Limits in Pedestal Profile Measurements with Gaussian Process Regression. 2025.
Warning: These citations may not always be 100% accurate.