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| Autori principali: | , , , , , , , |
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| Natura: | Preprint |
| Pubblicazione: |
2025
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| Soggetti: | |
| Accesso online: | https://arxiv.org/abs/2507.05588 |
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| _version_ | 1866911044894457856 |
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| author | Li, Shuai Chen, Shihan Geng, Wanru Xu, Zhaohua Liu, Xiaolu Dong, Can Tian, Zhen Chen, Changlin |
| author_facet | Li, Shuai Chen, Shihan Geng, Wanru Xu, Zhaohua Liu, Xiaolu Dong, Can Tian, Zhen Chen, Changlin |
| contents | In the realm of industrial quality inspection, defect detection stands as a critical component, particularly in high-precision, safety-critical sectors such as automotive components aerospace, and medical devices. Traditional methods, reliant on manual inspection or early image processing algorithms, suffer from inefficiencies, high costs, and limited robustness. This paper introduces a semi-supervised defect detection framework based on conditional diffusion (DSYM), leveraging a two-stage collaborative training mechanism and a staged joint optimization strategy. The framework utilizes labeled data for initial training and subsequently incorporates unlabeled data through the generation of pseudo-labels. A conditional diffusion model synthesizes multi-scale pseudo-defect samples, while a CLIP cross-modal feature-based noise filtering mechanism mitigates label contamination. Experimental results on the NEU-DET dataset demonstrate a 78.4% mAP@0.5 with the same amount of labeled data as traditional supervised methods, and 75.1% mAP@0.5 with only 40% of the labeled data required by the original supervised model, showcasing significant advantages in data efficiency. This research provides a high-precision, low-labeling-dependent solution for defect detection in industrial quality inspection scenarios. The work of this article has been open-sourced at https://github.com/cLin-c/Semisupervised-DSYM. |
| format | Preprint |
| id |
arxiv_https___arxiv_org_abs_2507_05588 |
| institution | arXiv |
| publishDate | 2025 |
| record_format | arxiv |
| spellingShingle | Semi-Supervised Defect Detection via Conditional Diffusion and CLIP-Guided Noise Filtering Li, Shuai Chen, Shihan Geng, Wanru Xu, Zhaohua Liu, Xiaolu Dong, Can Tian, Zhen Chen, Changlin Computer Vision and Pattern Recognition In the realm of industrial quality inspection, defect detection stands as a critical component, particularly in high-precision, safety-critical sectors such as automotive components aerospace, and medical devices. Traditional methods, reliant on manual inspection or early image processing algorithms, suffer from inefficiencies, high costs, and limited robustness. This paper introduces a semi-supervised defect detection framework based on conditional diffusion (DSYM), leveraging a two-stage collaborative training mechanism and a staged joint optimization strategy. The framework utilizes labeled data for initial training and subsequently incorporates unlabeled data through the generation of pseudo-labels. A conditional diffusion model synthesizes multi-scale pseudo-defect samples, while a CLIP cross-modal feature-based noise filtering mechanism mitigates label contamination. Experimental results on the NEU-DET dataset demonstrate a 78.4% mAP@0.5 with the same amount of labeled data as traditional supervised methods, and 75.1% mAP@0.5 with only 40% of the labeled data required by the original supervised model, showcasing significant advantages in data efficiency. This research provides a high-precision, low-labeling-dependent solution for defect detection in industrial quality inspection scenarios. The work of this article has been open-sourced at https://github.com/cLin-c/Semisupervised-DSYM. |
| title | Semi-Supervised Defect Detection via Conditional Diffusion and CLIP-Guided Noise Filtering |
| topic | Computer Vision and Pattern Recognition |
| url | https://arxiv.org/abs/2507.05588 |