Nishikawa, G., Nakata, W., Saito, Y., Imamura, K., Saruwatari, H., & Nakamura, T. (2025). Multi-Sampling-Frequency Naturalness MOS Prediction Using Self-Supervised Learning Model with Sampling-Frequency-Independent Layer.
Style de citation Chicago (17e éd.)Nishikawa, Go, Wataru Nakata, Yuki Saito, Kanami Imamura, Hiroshi Saruwatari, et Tomohiko Nakamura. Multi-Sampling-Frequency Naturalness MOS Prediction Using Self-Supervised Learning Model with Sampling-Frequency-Independent Layer. 2025.
Style de citation MLA (9e éd.)Nishikawa, Go, et al. Multi-Sampling-Frequency Naturalness MOS Prediction Using Self-Supervised Learning Model with Sampling-Frequency-Independent Layer. 2025.
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