APA (7th ed.) Citation

Kovaleva, N. N., Chvostova, D., Fursova, T. N., Muratov, A. V., Bozhko, S. I., Aleshchenko, Y. A., . . . Kugel, K. I. (2025). Electronic localization on the structural inhomogeneities formed due to Bi and Te deficiency in the MBE grown films of AFM topological insulator MnBi2Te4: Evidence from spectroscopic ellipsometry and infrared studies.

Chicago Style (17th ed.) Citation

Kovaleva, N. N., et al. Electronic Localization on the Structural Inhomogeneities Formed Due to Bi and Te Deficiency in the MBE Grown Films of AFM Topological Insulator MnBi2Te4: Evidence from Spectroscopic Ellipsometry and Infrared Studies. 2025.

MLA (9th ed.) Citation

Kovaleva, N. N., et al. Electronic Localization on the Structural Inhomogeneities Formed Due to Bi and Te Deficiency in the MBE Grown Films of AFM Topological Insulator MnBi2Te4: Evidence from Spectroscopic Ellipsometry and Infrared Studies. 2025.