Abdollahpour, M., Bockelmann, C., Rahman, T. M. H., Dekorsy, A., & Fischer, A. (2025). Compressed Learning for Nanosurface Deficiency Recognition Using Angle-resolved Scatterometry Data.
Chicago Style (17th ed.) CitationAbdollahpour, Mehdi, Carsten Bockelmann, Tajim Md Hasibur Rahman, Armin Dekorsy, and Andreas Fischer. Compressed Learning for Nanosurface Deficiency Recognition Using Angle-resolved Scatterometry Data. 2025.
MLA (9th ed.) CitationAbdollahpour, Mehdi, et al. Compressed Learning for Nanosurface Deficiency Recognition Using Angle-resolved Scatterometry Data. 2025.
Warning: These citations may not always be 100% accurate.