Schönfeld, M., Meert, W., & Blockeel, H. (2025). Tailored Transformation Invariance for Industrial Anomaly Detection.
Cita Chicago Style (17a ed.)Schönfeld, Mariette, Wannes Meert, y Hendrik Blockeel. Tailored Transformation Invariance for Industrial Anomaly Detection. 2025.
Cita MLA (9a ed.)Schönfeld, Mariette, et al. Tailored Transformation Invariance for Industrial Anomaly Detection. 2025.
Precaución: Estas citas no son 100% exactas.