Mao, W., Wang, C., Chou, P., & Liu, Y. (2025). Automated Defect Detection for Mass-Produced Electronic Components Based on YOLO Object Detection Models.
Chicago-Zitierstil (17. Ausg.)Mao, Wei-Lung, Chun-Chi Wang, Po-Heng Chou, und Yen-Ting Liu. Automated Defect Detection for Mass-Produced Electronic Components Based on YOLO Object Detection Models. 2025.
MLA-Zitierstil (9. Ausg.)Mao, Wei-Lung, et al. Automated Defect Detection for Mass-Produced Electronic Components Based on YOLO Object Detection Models. 2025.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.