APA (7th ed.) Citation

Mao, W., Wang, C., Chou, P., & Liu, Y. (2025). Automated Defect Detection for Mass-Produced Electronic Components Based on YOLO Object Detection Models.

Chicago Style (17th ed.) Citation

Mao, Wei-Lung, Chun-Chi Wang, Po-Heng Chou, and Yen-Ting Liu. Automated Defect Detection for Mass-Produced Electronic Components Based on YOLO Object Detection Models. 2025.

MLA (9th ed.) Citation

Mao, Wei-Lung, et al. Automated Defect Detection for Mass-Produced Electronic Components Based on YOLO Object Detection Models. 2025.