Hitzelhammer, F., Dong, J., Hohenester, U., & Juffmann, T. (2025). When Higher Resolution Reduces Precision: Quantum Limits of Off-Axis Interferometric Scattering Microscopy.
Cita Chicago Style (17a ed.)Hitzelhammer, Felix, Jonathan Dong, Ulrich Hohenester, y Thomas Juffmann. When Higher Resolution Reduces Precision: Quantum Limits of Off-Axis Interferometric Scattering Microscopy. 2025.
Cita MLA (9a ed.)Hitzelhammer, Felix, et al. When Higher Resolution Reduces Precision: Quantum Limits of Off-Axis Interferometric Scattering Microscopy. 2025.
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