Okazaki, S., Kaminishi, K., Fujiu, T., Wang, Y., & Ota, J. (2025). Fault Cause Identification across Manufacturing Lines through Ontology-Guided and Process-Aware FMEA Graph Learning with LLMs.
Chicago-Zitierstil (17. Ausg.)Okazaki, Sho, Kohei Kaminishi, Takuma Fujiu, Yusheng Wang, und Jun Ota. Fault Cause Identification Across Manufacturing Lines Through Ontology-Guided and Process-Aware FMEA Graph Learning with LLMs. 2025.
MLA-Zitierstil (9. Ausg.)Okazaki, Sho, et al. Fault Cause Identification Across Manufacturing Lines Through Ontology-Guided and Process-Aware FMEA Graph Learning with LLMs. 2025.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.