APA (7th ed.) Citation

Okazaki, S., Kaminishi, K., Fujiu, T., Wang, Y., & Ota, J. (2025). Fault Cause Identification across Manufacturing Lines through Ontology-Guided and Process-Aware FMEA Graph Learning with LLMs.

Chicago Style (17th ed.) Citation

Okazaki, Sho, Kohei Kaminishi, Takuma Fujiu, Yusheng Wang, and Jun Ota. Fault Cause Identification Across Manufacturing Lines Through Ontology-Guided and Process-Aware FMEA Graph Learning with LLMs. 2025.

MLA (9th ed.) Citation

Okazaki, Sho, et al. Fault Cause Identification Across Manufacturing Lines Through Ontology-Guided and Process-Aware FMEA Graph Learning with LLMs. 2025.