Menzel, M. W. (2025). Yield and performance validation of the Monolithic Stitched Sensor (MOSS), the first wafer-scale prototype for the ALICE ITS3 upgrade.
Style de citation Chicago (17e éd.)Menzel, Marius Wilm. Yield and Performance Validation of the Monolithic Stitched Sensor (MOSS), the First Wafer-scale Prototype for the ALICE ITS3 Upgrade. 2025.
Style de citation MLA (9e éd.)Menzel, Marius Wilm. Yield and Performance Validation of the Monolithic Stitched Sensor (MOSS), the First Wafer-scale Prototype for the ALICE ITS3 Upgrade. 2025.
Attention : ces citations peuvent ne pas être correctes à 100%.