Guo, B., Zuo, Q., & Yu, R. (2025). Point Cloud Segmentation of Integrated Circuits Package Substrates Surface Defects Using Causal Inference: Dataset Construction and Methodology.
Chicago Style (17th ed.) CitationGuo, Bingyang, Qiang Zuo, and Ruiyun Yu. Point Cloud Segmentation of Integrated Circuits Package Substrates Surface Defects Using Causal Inference: Dataset Construction and Methodology. 2025.
MLA (9th ed.) CitationGuo, Bingyang, et al. Point Cloud Segmentation of Integrated Circuits Package Substrates Surface Defects Using Causal Inference: Dataset Construction and Methodology. 2025.
Warning: These citations may not always be 100% accurate.