Ardizzi, A. J., Zhang, J., Babenko, A. A., Cleary, K. A., & Minnich, A. J. (2025). Variable-temperature attenuator calibration method for on-wafer microwave noise characterization of low-noise amplifiers.
Citazione stile Chigago Style (17a edizione)Ardizzi, Anthony J., Jiayin Zhang, Akim A. Babenko, Kieran A. Cleary, e Austin J. Minnich. Variable-temperature Attenuator Calibration Method for On-wafer Microwave Noise Characterization of Low-noise Amplifiers. 2025.
Citatione MLA (9a ed.)Ardizzi, Anthony J., et al. Variable-temperature Attenuator Calibration Method for On-wafer Microwave Noise Characterization of Low-noise Amplifiers. 2025.
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