Belhaj, M., & dadouch, S. (2025). Electron Emission Yield Datasets Under Electron Impact From Surfaces Characterized In Situ by XPS or AES.
Citazione stile Chigago Style (17a edizione)Belhaj, M., e S. dadouch. Electron Emission Yield Datasets Under Electron Impact From Surfaces Characterized In Situ by XPS or AES. 2025.
Citatione MLA (9a ed.)Belhaj, M., e S. dadouch. Electron Emission Yield Datasets Under Electron Impact From Surfaces Characterized In Situ by XPS or AES. 2025.
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