APA (7th ed.) Citation

Tian, H., Yang, J., & Liu, M. (2025). Nucleation suppression by charge screening on grain boundaries: A kinetic model for bulk imprint in polycrystalline ferroelectric thin films.

Chicago Style (17th ed.) Citation

Tian, Huanhuan, Jianguo Yang, and Ming Liu. Nucleation Suppression by Charge Screening on Grain Boundaries: A Kinetic Model for Bulk Imprint in Polycrystalline Ferroelectric Thin Films. 2025.

MLA (9th ed.) Citation

Tian, Huanhuan, et al. Nucleation Suppression by Charge Screening on Grain Boundaries: A Kinetic Model for Bulk Imprint in Polycrystalline Ferroelectric Thin Films. 2025.