Cita APA (7a ed.)

Li, W., Zou, Y., Liang, Y., Moura, J., & Blanton, S. (2025). DEFT: Differentiable Automatic Test Pattern Generation.

Cita Chicago Style (17a ed.)

Li, Wei, Yang Zou, Yixin Liang, José Moura, y Shawn Blanton. DEFT: Differentiable Automatic Test Pattern Generation. 2025.

Cita MLA (9a ed.)

Li, Wei, et al. DEFT: Differentiable Automatic Test Pattern Generation. 2025.