Chen, S., Niu, D., Chen, W., Song, J., Zhang, Y., Li, X., & Zio, E. (2026). Reliability Modeling of Single-Sided Aluminized Polyimide Films during Storage Considering Stress-Induced Degradation Mechanism Transition.
Chicago Style (17th ed.) CitationChen, Shi-Shun, Dong-Hua Niu, Wen-Bin Chen, Jia-Yun Song, Ya-Fei Zhang, Xiao-Yang Li, and Enrico Zio. Reliability Modeling of Single-Sided Aluminized Polyimide Films During Storage Considering Stress-Induced Degradation Mechanism Transition. 2026.
MLA (9th ed.) CitationChen, Shi-Shun, et al. Reliability Modeling of Single-Sided Aluminized Polyimide Films During Storage Considering Stress-Induced Degradation Mechanism Transition. 2026.
Warning: These citations may not always be 100% accurate.