Cita APA (7a ed.)

Chen, S., Niu, D., Chen, W., Song, J., Zhang, Y., Li, X., & Zio, E. (2026). Reliability Modeling of Single-Sided Aluminized Polyimide Films during Storage Considering Stress-Induced Degradation Mechanism Transition.

Cita Chicago Style (17a ed.)

Chen, Shi-Shun, Dong-Hua Niu, Wen-Bin Chen, Jia-Yun Song, Ya-Fei Zhang, Xiao-Yang Li, y Enrico Zio. Reliability Modeling of Single-Sided Aluminized Polyimide Films During Storage Considering Stress-Induced Degradation Mechanism Transition. 2026.

Cita MLA (9a ed.)

Chen, Shi-Shun, et al. Reliability Modeling of Single-Sided Aluminized Polyimide Films During Storage Considering Stress-Induced Degradation Mechanism Transition. 2026.