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Hauptverfasser: Gourdoumanis, George Rafael, Oikonomou, Fotoini, Pantazi-Kypraiou, Maria, Stoikos, Pavlos, Axelou, Olympia, Tziouvaras, Athanasios, Karakonstantis, Georgios, Aladwani, Tahani, Anagnostopoulos, Christos, Shen, Yixian, Pathania, Anuj, Garcia-Ortiz, Alberto, Floros, George
Format: Preprint
Veröffentlicht: 2026
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Online-Zugang:https://arxiv.org/abs/2601.14347
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author Gourdoumanis, George Rafael
Oikonomou, Fotoini
Pantazi-Kypraiou, Maria
Stoikos, Pavlos
Axelou, Olympia
Tziouvaras, Athanasios
Karakonstantis, Georgios
Aladwani, Tahani
Anagnostopoulos, Christos
Shen, Yixian
Pathania, Anuj
Garcia-Ortiz, Alberto
Floros, George
author_facet Gourdoumanis, George Rafael
Oikonomou, Fotoini
Pantazi-Kypraiou, Maria
Stoikos, Pavlos
Axelou, Olympia
Tziouvaras, Athanasios
Karakonstantis, Georgios
Aladwani, Tahani
Anagnostopoulos, Christos
Shen, Yixian
Pathania, Anuj
Garcia-Ortiz, Alberto
Floros, George
contents As semiconductor manufacturing advances from the 3-nm process toward the sub-nanometer regime and transitions from FinFETs to gate-all-around field-effect transistors (GAAFETs), the resulting complexity and manufacturing challenges continue to increase. In this context, 3D chiplet-based approaches have emerged as key enablers to address these limitations while exploiting the expanded design space. Specifically, chiplets help address the lower yields typically associated with large monolithic designs. This paradigm enables the modular design of heterogeneous systems consisting of multiple chiplets (e.g., CPUs, GPUs, memory) fabricated using different technology nodes and processes. Consequently, it offers a capable and cost-effective strategy for designing heterogeneous systems. This paper introduces the Horizon Europe Twinning project COIN-3D (Collaborative Innovation in 3D VLSI Reliability), which aims to strengthen research excellence in 2.5D/3D VLSI systems reliability through collaboration between leading European institutions. More specifically, our primary scientific goal is the provision of novel open-source Electronic Design Automation (EDA) tools for reliability assessment of 3D systems, integrating advanced algorithms for physical- and system-level reliability analysis.
format Preprint
id arxiv_https___arxiv_org_abs_2601_14347
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle Multi-Partner Project: COIN-3D -- Collaborative Innovation in 3D VLSI Reliability
Gourdoumanis, George Rafael
Oikonomou, Fotoini
Pantazi-Kypraiou, Maria
Stoikos, Pavlos
Axelou, Olympia
Tziouvaras, Athanasios
Karakonstantis, Georgios
Aladwani, Tahani
Anagnostopoulos, Christos
Shen, Yixian
Pathania, Anuj
Garcia-Ortiz, Alberto
Floros, George
Hardware Architecture
As semiconductor manufacturing advances from the 3-nm process toward the sub-nanometer regime and transitions from FinFETs to gate-all-around field-effect transistors (GAAFETs), the resulting complexity and manufacturing challenges continue to increase. In this context, 3D chiplet-based approaches have emerged as key enablers to address these limitations while exploiting the expanded design space. Specifically, chiplets help address the lower yields typically associated with large monolithic designs. This paradigm enables the modular design of heterogeneous systems consisting of multiple chiplets (e.g., CPUs, GPUs, memory) fabricated using different technology nodes and processes. Consequently, it offers a capable and cost-effective strategy for designing heterogeneous systems. This paper introduces the Horizon Europe Twinning project COIN-3D (Collaborative Innovation in 3D VLSI Reliability), which aims to strengthen research excellence in 2.5D/3D VLSI systems reliability through collaboration between leading European institutions. More specifically, our primary scientific goal is the provision of novel open-source Electronic Design Automation (EDA) tools for reliability assessment of 3D systems, integrating advanced algorithms for physical- and system-level reliability analysis.
title Multi-Partner Project: COIN-3D -- Collaborative Innovation in 3D VLSI Reliability
topic Hardware Architecture
url https://arxiv.org/abs/2601.14347