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Main Authors: Fields, Shelby Sutton, White, Christopher David, Knipling, Keith, Bennett, Steven
Format: Preprint
Published: 2026
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Online Access:https://arxiv.org/abs/2601.16055
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author Fields, Shelby Sutton
White, Christopher David
Knipling, Keith
Bennett, Steven
author_facet Fields, Shelby Sutton
White, Christopher David
Knipling, Keith
Bennett, Steven
contents Combinatorial sputtering is a physical vapor deposition method that enables the high-throughput synthesis of compositionally varied thin films. Using this technique, the effects of stoichiometry on specific properties of alloy thin films with analog composition gradients can be mapped using high-throughput characterization. To obtain specific stoichiometries, such as those desired for an equiatomic, intermetallic, or doped compounds, the sputter power of each target must be simultaneously tuned to optimize the deposition rate of each component. This optimization problem increases in complexity with the number of components, which commonly leads to iterative guess-and-check processing and can limit the intrinsic high-throughput advantages of this synthesis method. To circumvent this challenge, this work introduces a composition optimization procedure that enables the facile synthesis of sputtered combinatorial films with targeted compositions. This procedure leverages the expeditious mapping of composition using wavelength dispersive x-ray fluorescence and is capable of optimizing processing for an arbitrary number of components. As a demonstration, this method is leveraged to sputter a combinatorial Cr$_{v}$Fe$_{w}$Mo$_{x}$Nb$_{y}$Ta$_{z}$ film with an equiatomic composition near the wafer center.
format Preprint
id arxiv_https___arxiv_org_abs_2601_16055
institution arXiv
publishDate 2026
record_format arxiv
spellingShingle Facile Optimization of Combinatorial Sputtering Processes with Arbitrary Numbers of Components for Targeted Compositions
Fields, Shelby Sutton
White, Christopher David
Knipling, Keith
Bennett, Steven
Materials Science
Combinatorial sputtering is a physical vapor deposition method that enables the high-throughput synthesis of compositionally varied thin films. Using this technique, the effects of stoichiometry on specific properties of alloy thin films with analog composition gradients can be mapped using high-throughput characterization. To obtain specific stoichiometries, such as those desired for an equiatomic, intermetallic, or doped compounds, the sputter power of each target must be simultaneously tuned to optimize the deposition rate of each component. This optimization problem increases in complexity with the number of components, which commonly leads to iterative guess-and-check processing and can limit the intrinsic high-throughput advantages of this synthesis method. To circumvent this challenge, this work introduces a composition optimization procedure that enables the facile synthesis of sputtered combinatorial films with targeted compositions. This procedure leverages the expeditious mapping of composition using wavelength dispersive x-ray fluorescence and is capable of optimizing processing for an arbitrary number of components. As a demonstration, this method is leveraged to sputter a combinatorial Cr$_{v}$Fe$_{w}$Mo$_{x}$Nb$_{y}$Ta$_{z}$ film with an equiatomic composition near the wafer center.
title Facile Optimization of Combinatorial Sputtering Processes with Arbitrary Numbers of Components for Targeted Compositions
topic Materials Science
url https://arxiv.org/abs/2601.16055