Zhou, S., Cai, H., Wu, Y., Min, Y., Yuan, R., Lv, Y., . . . Illarionov, Y. Y. (2026). Mobile charges in MoS2/high-k oxide transistors: From abnormal instabilities to memory-like dynamics.
Chicago Style (17th ed.) CitationZhou, Shaokai, Haihui Cai, Yehao Wu, Yufeng Min, Renchen Yuan, Yezhu Lv, Jianming Huang, Yuanyuan Shi, and Yury Yuryevich Illarionov. Mobile Charges in MoS2/high-k Oxide Transistors: From Abnormal Instabilities to Memory-like Dynamics. 2026.
MLA (9th ed.) CitationZhou, Shaokai, et al. Mobile Charges in MoS2/high-k Oxide Transistors: From Abnormal Instabilities to Memory-like Dynamics. 2026.
Warning: These citations may not always be 100% accurate.