Tan, J. J., Schreiner, R., Hausladen, M., Asgharzade, A., Edler, S., Bartsch, J., . . . Hum, Y. (2026). SiMiC: Context-Aware Silicon Microstructure Characterization Using Attention-Based Convolutional Neural Networks for Field-Emission Tip Analysis.
Chicago Style (17th ed.) CitationTan, Jing Jie, et al. SiMiC: Context-Aware Silicon Microstructure Characterization Using Attention-Based Convolutional Neural Networks for Field-Emission Tip Analysis. 2026.
MLA (9th ed.) CitationTan, Jing Jie, et al. SiMiC: Context-Aware Silicon Microstructure Characterization Using Attention-Based Convolutional Neural Networks for Field-Emission Tip Analysis. 2026.
Warning: These citations may not always be 100% accurate.