Tan, J. J., Schreiner, R., Hausladen, M., Asgharzade, A., Edler, S., Bartsch, J., . . . Hum, Y. (2026). SiMiC: Context-Aware Silicon Microstructure Characterization Using Attention-Based Convolutional Neural Networks for Field-Emission Tip Analysis.
Citazione stile Chigago Style (17a edizione)Tan, Jing Jie, et al. SiMiC: Context-Aware Silicon Microstructure Characterization Using Attention-Based Convolutional Neural Networks for Field-Emission Tip Analysis. 2026.
Citatione MLA (9a ed.)Tan, Jing Jie, et al. SiMiC: Context-Aware Silicon Microstructure Characterization Using Attention-Based Convolutional Neural Networks for Field-Emission Tip Analysis. 2026.
Attenzione: Queste citazioni potrebbero non essere precise al 100%.