APA (7th ed.) Citation

Xie, Y., Shi, H., Huang, M., Chu, W., Chen, S., & Gong, X. (2026). Symmetry Adapted Analysis of Screw Dislocation: Electronic Structure and Carrier Recombination Mechanisms in GaN.

Chicago Style (17th ed.) Citation

Xie, Yuncheng, Haozhe Shi, Menglin Huang, Weibin Chu, Shiyou Chen, and Xin-Gao Gong. Symmetry Adapted Analysis of Screw Dislocation: Electronic Structure and Carrier Recombination Mechanisms in GaN. 2026.

MLA (9th ed.) Citation

Xie, Yuncheng, et al. Symmetry Adapted Analysis of Screw Dislocation: Electronic Structure and Carrier Recombination Mechanisms in GaN. 2026.