Armato, A., Khatun, M., & Fischer, S. (2026). An Integrated Failure and Threat Mode and Effect Analysis (FTMEA) Framework with Quantified Cross-Domain Correlation Factors for Automotive Semiconductors.
Cita Chicago Style (17a ed.)Armato, Antonino, Marzana Khatun, y Sebastian Fischer. An Integrated Failure and Threat Mode and Effect Analysis (FTMEA) Framework with Quantified Cross-Domain Correlation Factors for Automotive Semiconductors. 2026.
Cita MLA (9a ed.)Armato, Antonino, et al. An Integrated Failure and Threat Mode and Effect Analysis (FTMEA) Framework with Quantified Cross-Domain Correlation Factors for Automotive Semiconductors. 2026.
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