APA (7th ed.) Citation

Viklund, E., Seidman, D. N., & Posen, S. (2026). Microstructural Characterization of Nb3Sn Thin Films Using FIB Tomography.

Chicago Style (17th ed.) Citation

Viklund, Eric, David N. Seidman, and Sam Posen. Microstructural Characterization of Nb3Sn Thin Films Using FIB Tomography. 2026.

MLA (9th ed.) Citation

Viklund, Eric, et al. Microstructural Characterization of Nb3Sn Thin Films Using FIB Tomography. 2026.

Warning: These citations may not always be 100% accurate.