Style de citation APA (7e éd.)

Larrazabal, M. O., Niu, J., McMillan, S. R., Koenraad, P. M., Flatté, M. E., Allan, M. P., & Swart, I. (2026). Imaging the high-frequency charging dynamics of a single impurity in a semiconductor on the atomic scale.

Style de citation Chicago (17e éd.)

Larrazabal, Maialen Ortego, Jiasen Niu, Stephen R. McMillan, Paul M. Koenraad, Michael E. Flatté, Milan P. Allan, et Ingmar Swart. Imaging the High-frequency Charging Dynamics of a Single Impurity in a Semiconductor on the Atomic Scale. 2026.

Style de citation MLA (9e éd.)

Larrazabal, Maialen Ortego, et al. Imaging the High-frequency Charging Dynamics of a Single Impurity in a Semiconductor on the Atomic Scale. 2026.