Wei, Z., Shen, Y., Lu, W., Ho, G. W., & Zeng, K. (2026). From Artefact to Insight: Efficient Low-Rank Adaptation of BrushNet for Scanning Probe Microscopy Image Restoration.
Citazione stile Chigago Style (17a edizione)Wei, Ziwei, Yao Shen, Wanheng Lu, Ghim Wei Ho, e Kaiyang Zeng. From Artefact to Insight: Efficient Low-Rank Adaptation of BrushNet for Scanning Probe Microscopy Image Restoration. 2026.
Citatione MLA (9a ed.)Wei, Ziwei, et al. From Artefact to Insight: Efficient Low-Rank Adaptation of BrushNet for Scanning Probe Microscopy Image Restoration. 2026.
Attenzione: Queste citazioni potrebbero non essere precise al 100%.