Gehrmann, C., Ricker, J., Damm, S., Cheng, D., Speith, J., Shi, Y., . . . Paar, C. (2026). SAMSEM -- A Generic and Scalable Approach for IC Metal Line Segmentation.
Cita Chicago Style (17a ed.)Gehrmann, Christian, Jonas Ricker, Simon Damm, Deruo Cheng, Julian Speith, Yiqiong Shi, Asja Fischer, y Christof Paar. SAMSEM -- A Generic and Scalable Approach for IC Metal Line Segmentation. 2026.
Cita MLA (9a ed.)Gehrmann, Christian, et al. SAMSEM -- A Generic and Scalable Approach for IC Metal Line Segmentation. 2026.
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