Karbasizadeh, S., Yang, W., Ko, W., Zhou, H., Li, A., Berlijn, T., & Mu, S. (2026). Revealing Charge Transfer in Defect-Engineered 4H$_\mathrm{b}$-TaS$_2$.
Cita Chicago Style (17a ed.)Karbasizadeh, Siavash, Wooin Yang, Wonhee Ko, Haidong Zhou, An-Ping Li, Tom Berlijn, y Sai Mu. Revealing Charge Transfer in Defect-Engineered 4H$_\mathrm{b}$-TaS$_2$. 2026.
Cita MLA (9a ed.)Karbasizadeh, Siavash, et al. Revealing Charge Transfer in Defect-Engineered 4H$_\mathrm{b}$-TaS$_2$. 2026.
Precaución: Estas citas no son 100% exactas.