Chen, S., Spieß, L. J., Wilzewski, A., Wehrheim, M., López-Urrutia, J. R. C., & Schmidt, P. O. (2026). Characterization of rf field-induced a.c. Zeeman shift in multi-level highly charged ions.
Cita Chicago Style (17a ed.)Chen, Shuying, Lukas J. Spieß, Alexander Wilzewski, Malte Wehrheim, José R. Crespo López-Urrutia, y Piet O. Schmidt. Characterization of Rf Field-induced A.c. Zeeman Shift in Multi-level Highly Charged Ions. 2026.
Cita MLA (9a ed.)Chen, Shuying, et al. Characterization of Rf Field-induced A.c. Zeeman Shift in Multi-level Highly Charged Ions. 2026.
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