Yang, H., Hu, R., Wu, H., He, X., Zhou, Y., Xue, Y., . . . Xie, Y. (2026). Identification and Structural Characterization of Twisted Atomically Thin Bilayer Materials by Deep Learning.
Style de citation Chicago (17e éd.)Yang, Haitao, et al. Identification and Structural Characterization of Twisted Atomically Thin Bilayer Materials by Deep Learning. 2026.
Style de citation MLA (9e éd.)Yang, Haitao, et al. Identification and Structural Characterization of Twisted Atomically Thin Bilayer Materials by Deep Learning. 2026.
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