Cita APA (7a ed.)

Liu, F., Guo, M., Chen, S., Jiang, Y., Liu, M., & Wang, Y. (2026). Stochastic first-passage modeling of single-event burnout in SiC power MOSFETs.

Cita Chicago Style (17a ed.)

Liu, Feiyi, Min Guo, Shiyang Chen, Yuhan Jiang, Mingyang Liu, y Yang Wang. Stochastic First-passage Modeling of Single-event Burnout in SiC Power MOSFETs. 2026.

Cita MLA (9a ed.)

Liu, Feiyi, et al. Stochastic First-passage Modeling of Single-event Burnout in SiC Power MOSFETs. 2026.