Yoon, Y., Lee, S., Song, S., Wang, S., Chen, W., & Ok, J. (2026). PaT: Planning-after-Trial for Efficient Test-Time Code Generation.
Citazione stile Chigago Style (17a edizione)Yoon, Youngsik, Sungjae Lee, Seockbean Song, Siwei Wang, Wei Chen, e Jungseul Ok. PaT: Planning-after-Trial for Efficient Test-Time Code Generation. 2026.
Citatione MLA (9a ed.)Yoon, Youngsik, et al. PaT: Planning-after-Trial for Efficient Test-Time Code Generation. 2026.
Attenzione: Queste citazioni potrebbero non essere precise al 100%.